Lithography Process Control

Lithography Process Control
Author :
Publisher : SPIE Press
Total Pages : 210
Release :
ISBN-10 : 0819430528
ISBN-13 : 9780819430526
Rating : 4/5 (28 Downloads)

Book Synopsis Lithography Process Control by : Harry J. Levinson

Download or read book Lithography Process Control written by Harry J. Levinson and published by SPIE Press. This book was released on 1999 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text covers lithography process control at several levels, from fundamental through advanced topics. The book is a self-contained tutorial that works both as an introduction to the technology and as a reference for the experienced lithographer. It reviews the foundations of statistical process control as background for advanced topics such as complex processes and feedback. In addition, it presents control methodologies that may be applied to process development pilot lines.

Fundamentals of Semiconductor Manufacturing and Process Control

Fundamentals of Semiconductor Manufacturing and Process Control
Author :
Publisher : John Wiley & Sons
Total Pages : 428
Release :
ISBN-10 : 9780471790273
ISBN-13 : 0471790273
Rating : 4/5 (73 Downloads)

Book Synopsis Fundamentals of Semiconductor Manufacturing and Process Control by : Gary S. May

Download or read book Fundamentals of Semiconductor Manufacturing and Process Control written by Gary S. May and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.

Advanced Processes for 193-nm Immersion Lithography

Advanced Processes for 193-nm Immersion Lithography
Author :
Publisher : SPIE Press
Total Pages : 338
Release :
ISBN-10 : 9780819475572
ISBN-13 : 0819475572
Rating : 4/5 (72 Downloads)

Book Synopsis Advanced Processes for 193-nm Immersion Lithography by : Yayi Wei

Download or read book Advanced Processes for 193-nm Immersion Lithography written by Yayi Wei and published by SPIE Press. This book was released on 2009 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to advanced processes and materials used in 193-nm immersion lithography (193i). It is an important text for those new to the field as well as for current practitioners who want to broaden their understanding of this latest technology. The book can be used as course material for graduate students of electrical engineering, material sciences, physics, chemistry, and microelectronics engineering and can also be used to train engineers involved in the manufacture of integrated circuits. It provides techniques for selecting critical materials (topcoats, photoresists, and antireflective coatings) and optimizing immersion processes to ensure higher performance and lower defectivity at lower cost. This book also includes sections on shrinking, trimming, and smoothing of the resist pattern to reduce feature sizes and line-edge roughness. Finally, it describes the recent development of 193i in combination with double exposure and double patterning.

Run-to-Run Control in Semiconductor Manufacturing

Run-to-Run Control in Semiconductor Manufacturing
Author :
Publisher : CRC Press
Total Pages : 368
Release :
ISBN-10 : 9781420040661
ISBN-13 : 1420040669
Rating : 4/5 (61 Downloads)

Book Synopsis Run-to-Run Control in Semiconductor Manufacturing by : James Moyne

Download or read book Run-to-Run Control in Semiconductor Manufacturing written by James Moyne and published by CRC Press. This book was released on 2018-10-08 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.

Extreme Ultraviolet Lithography

Extreme Ultraviolet Lithography
Author :
Publisher :
Total Pages : 245
Release :
ISBN-10 : 151063939X
ISBN-13 : 9781510639393
Rating : 4/5 (9X Downloads)

Book Synopsis Extreme Ultraviolet Lithography by : Harry J. Levinson

Download or read book Extreme Ultraviolet Lithography written by Harry J. Levinson and published by . This book was released on 2020 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fundamental Principles of Optical Lithography

Fundamental Principles of Optical Lithography
Author :
Publisher : John Wiley & Sons
Total Pages : 503
Release :
ISBN-10 : 9781119965077
ISBN-13 : 1119965071
Rating : 4/5 (77 Downloads)

Book Synopsis Fundamental Principles of Optical Lithography by : Chris Mack

Download or read book Fundamental Principles of Optical Lithography written by Chris Mack and published by John Wiley & Sons. This book was released on 2011-08-10 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fabrication of an integrated circuit requires a variety of physical and chemical processes to be performed on a semiconductor substrate. In general, these processes fall into three categories: film deposition, patterning, and semiconductor doping. Films of both conductors and insulators are used to connect and isolate transistors and their components. By creating structures of these various components millions of transistors can be built and wired together to form the complex circuitry of modern microelectronic devices. Fundamental to all of these processes is lithography, ie, the formation of three-dimensional relief images on the substrate for subsequent transfer of the pattern to the substrate. This book presents a complete theoretical and practical treatment of the topic of lithography for both students and researchers. It comprises ten detailed chapters plus three appendices with problems provided at the end of each chapter. Additional Information: Visiting http://www.lithoguru.com/textbook/index.html enhances the reader's understanding as the website supplies information on how you can download a free laboratory manual, Optical Lithography Modelling with MATLABĀ®, to accompany the textbook. You can also contact the author and find help for instructors.

Printing-process Control and Standardization

Printing-process Control and Standardization
Author :
Publisher : RIT Cary Graphic Arts Press
Total Pages : 0
Release :
ISBN-10 : 1939125758
ISBN-13 : 9781939125750
Rating : 4/5 (58 Downloads)

Book Synopsis Printing-process Control and Standardization by : Robert Chung

Download or read book Printing-process Control and Standardization written by Robert Chung and published by RIT Cary Graphic Arts Press. This book was released on 2020 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "In Printing-Process Control and Standardization, Robert Chung explains the process of color printing with relevant examples related to measurement, process-control, color management, and standardization. Chung provides detailed information for teaching students in print media or graphic communication, as well as for seasoned industry professionals"--