Information Modelling and Knowledge Bases XXXIII
Author | : M. Tropmann-Frick |
Publisher | : IOS Press |
Total Pages | : 348 |
Release | : 2022-02-09 |
ISBN-10 | : 9781643682433 |
ISBN-13 | : 1643682431 |
Rating | : 4/5 (33 Downloads) |
Download or read book Information Modelling and Knowledge Bases XXXIII written by M. Tropmann-Frick and published by IOS Press. This book was released on 2022-02-09 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: The technology of information modelling and knowledge bases addresses the complexities of modelling in digital transformation and digital innovation, reaching beyond the traditional borders of information systems and academic research in computer science. This book presents 21 papers from the 31st International conference on Information Modeling and Knowledge Bases (EJC 2021), hosted by the Department Informatik of the University of Applied Sciences in Hamburg, Germany, and held as a virtual event from 7 to 9 September 2021 due to restrictions caused by the Corona virus. The conference provides a research forum for academics and practitioners dealing with information and knowledge to exchange scientific results and experiences, and EJC 2021 covered a wide range of themes extending knowledge discovery through conceptual modeling, knowledge and information modeling and discovery, linguistic modeling, cross-cultural communication and social computing, environmental modeling and engineering, and multimedia data modeling and systems. As always, the conference was open to new topics related to its main themes, meaning the content emphasis of the EJC conferences is always able to adapt to the changes taking place in the research field, and the 21 papers included here after rigorous review, selection and upgrading are the result of presentations, comments, and discussions during the conference. Providing an up to the minute overview of the technology of information modeling and knowledge bases, the book will be of interest to all those working in the field.